Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Author: Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael

Publisher: Springer Science & Business Media

ISBN: 1461502152

Category: Technology & Engineering

Page: 689

View: 3215

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Scanning Electron Microscopy and X-Ray Microanalysis

Author: Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott,David C. Joy

Publisher: Springer

ISBN: 1493966766

Category: Technology & Engineering

Page: 550

View: 3325

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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
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Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Author: Joseph Goldstein,JOSEPH AUTOR GOLDSTEIN,Lyman,Dale E. Newbury,Dale E. (National Institute of Standards and Technology Newbury, Gaithersburg MD USA),David C. Joy,Patrick Echlin,Charles E. Lyman,Eric Lifshin,Oak Ridge National Laboratory Distinguished Scientist and Director Electron Microscope Facility David C Joy,Linda Sawyer,Charles E. (Lehigh University Lyman, Bethlehem PA USA),J.R. Michael,Joy,Michael,J.R. (Sandia National Laboratories Michael, Albuquerque NM USA)

Publisher: Boom Koninklijke Uitgevers

ISBN: 9780306472923

Category: Juvenile Nonfiction

Page: 689

View: 3884

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Release

Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Author: Joseph Goldstein,JOSEPH AUTOR GOLDSTEIN,Lyman,Dale E. Newbury,Dale E. (National Institute of Standards and Technology Newbury, Gaithersburg MD USA),David C. Joy,Patrick Echlin,Charles E. Lyman,Eric Lifshin,Oak Ridge National Laboratory Distinguished Scientist and Director Electron Microscope Facility David C Joy,Linda Sawyer,Charles E. (Lehigh University Lyman, Bethlehem PA USA),J.R. Michael,Joy,Michael,J.R. (Sandia National Laboratories Michael, Albuquerque NM USA)

Publisher: Boom Koninklijke Uitgevers

ISBN: 9780306472923

Category: Juvenile Nonfiction

Page: 689

View: 8845

DOWNLOAD NOW »

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)

Author: Debbie Stokes

Publisher: John Wiley & Sons

ISBN: 9780470758748

Category: Science

Page: 234

View: 4487

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Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
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Scanning Microscopy for Nanotechnology

Techniques and Applications

Author: Weilie Zhou,Zhong Lin Wang

Publisher: Springer Science & Business Media

ISBN: 0387396209

Category: Technology & Engineering

Page: 522

View: 5653

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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Energy Dispersive Spectrometry of Common Rock Forming Minerals

Author: Kenneth P. Severin

Publisher: Springer Science & Business Media

ISBN: 1402028415

Category: Science

Page: 225

View: 1507

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This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.
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Scanning Electron Microscopy

Physics of Image Formation and Microanalysis

Author: Ludwig Reimer

Publisher: Springer Science & Business Media

ISBN: 9783540639763

Category: Science

Page: 527

View: 1823

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Author: Patrick Echlin

Publisher: Springer Science & Business Media

ISBN: 9780387857312

Category: Technology & Engineering

Page: 332

View: 3259

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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
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