Reliability of Nanoscale Circuits and Systems

Reliability of Nanoscale Circuits and Systems

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques.

Author: Miloš Stanisavljević

Publisher: Springer Science & Business Media

ISBN: 1441962174

Category: Technology & Engineering

Page: 195

View: 406

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Categories: Technology & Engineering

Computational Intelligence in Digital and Network Designs and Applications

Computational Intelligence in Digital and Network Designs and Applications

Zhang, K.: Challenges and opportunities in nano-scale VLSI design, International
Symposium on VLSI Design, ... Stanisavljevic, M., Schmid, A., Leblebici, Y.:
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit ...

Author: Mourad Fakhfakh

Publisher: Springer

ISBN: 9783319200712

Category: Computers

Page: 350

View: 253

This book explains the application of recent advances in computational intelligence – algorithms, design methodologies, and synthesis techniques – to the design of integrated circuits and systems. It highlights new biasing and sizing approaches and optimization techniques and their application to the design of high-performance digital, VLSI, radio-frequency, and mixed-signal circuits and systems. This second of two related volumes addresses digital and network designs and applications, with 12 chapters grouped into parts on digital circuit design, network optimization, and applications. It will be of interest to practitioners and researchers in computer science and electronics engineering engaged with the design of electronic circuits.
Categories: Computers

IEEE International High Level Design Validation and Test Workshop

IEEE International High Level Design Validation and Test Workshop

Hence , these CMOS - nano hybrid designs must also be evaluated from a circuit
and system perspective , in terms of the four key metrics : power , performance ,
robustness and reliability . Since , all nanoscale technologies are expected to ...

Author:

Publisher:

ISBN: UIUC:30112061446214

Category: Computer software

Page:

View: 938

Categories: Computer software

IEEE Transactions on Circuits and Systems

IEEE Transactions on Circuits and Systems

A Publication of the IEEE Circuits and Systems Society. ... He is also interested of
semiconductor devices and circuits . ... His present research interests inCMOS /
BiCMOS integrated circuit design and reliability , high - k and nanoscale clude ...

Author:

Publisher:

ISBN: UIUC:30112076428207

Category: Electric circuits

Page:

View: 162

Categories: Electric circuits

Proceedings

Proceedings

... edu Abstract Nanocomputing system design has been attracting attention in
recent years . Regular structure and reliable timing control are the two
requirements to implement nanoscale circuits . A cellular array has highly regular
structure .

Author:

Publisher:

ISBN: UOM:39015058776801

Category: Integrated circuits

Page:

View: 520

Categories: Integrated circuits

Nanoelectronic Circuit Design

Nanoelectronic Circuit Design

This book is about large-scale electronic circuits design driven by nanotechnology, where nanotechnology is broadly defined as building circuits using nanoscale devices that are either implemented with nanomaterials (e.g., nanotubes or ...

Author: Niraj K. Jha

Publisher: Springer Science & Business Media

ISBN: 1441976094

Category: Technology & Engineering

Page: 485

View: 954

This book is about large-scale electronic circuits design driven by nanotechnology, where nanotechnology is broadly defined as building circuits using nanoscale devices that are either implemented with nanomaterials (e.g., nanotubes or nanowires) or following an unconventional method (e.g., FinFET or III/V compound-based devices). These nanoscale devices have significant potential to revolutionize the fabrication and integration of electronic systems and scale beyond the perceived scaling limitations of traditional CMOS. While innovations in nanotechnology originate at the individual device level, realizing the true impact of electronic systems demands that these device-level capabilities be translated into system-level benefits. This is the first book to focus on nanoscale circuits and their design issues, bridging the existing gap between nanodevice research and nanosystem design.
Categories: Technology & Engineering

Device and Circuit Techniques for Reducing Variation in Nanoscale SRAM

Device and Circuit Techniques for Reducing Variation in Nanoscale SRAM

Impact of negative bias temperature instability on digital circuit reliability . Intl .
Reliability Physics Symp . ... IEEE Transactions on Computer Aided Design of
Integrated Circuits and Systems , pages 1859–1880 , 2005 . ( 22 ] X. Li , J. Qin , B
. 60.

Author: Andrew Evert Carlson

Publisher:

ISBN: UCAL:C3528119

Category:

Page: 312

View: 319

Categories:

Managing Temperature Effects in Nanoscale Adaptive Systems

Managing Temperature Effects in Nanoscale Adaptive Systems

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.

Author: David Wolpert

Publisher: Springer Science & Business Media

ISBN: 1461407486

Category: Technology & Engineering

Page: 174

View: 809

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.
Categories: Technology & Engineering

Nanostructure Integration Techniques for Manufacturable Devices Circuits and Systems

Nanostructure Integration Techniques for Manufacturable Devices  Circuits  and Systems

Interfaces, Interconnects, and Nanosystems : 23-25 October, 2005, Boston,
Massachusetts, USA M. Saif Islam Minoru M. Freund, Achyut K. Dutta ... as
inability to controllably incorporate nanosized components within integrated
circuits , and to manufacture such devices with high reliability . This conference
considered existing and new integration methods of nano - scale structures and
devices with other ...

Author: M. Saif Islam

Publisher: Society of Photo Optical

ISBN: UOM:39015064781027

Category: Technology & Engineering

Page: 188

View: 240

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Categories: Technology & Engineering

Nanoscale Memory Repair

Nanoscale Memory Repair

This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS ...

Author: Masashi Horiguchi

Publisher: Springer Science & Business Media

ISBN: 1441979581

Category: Technology & Engineering

Page: 218

View: 250

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Categories: Technology & Engineering

Producing Reliable Nanoscale Self assembly

Producing Reliable Nanoscale Self assembly

While this system was believed to have good properties no proof was known
before our criteria . Finally , we ... 1.1.5 Carbon Nanotube Circuits We address
some theoretical questions related to carbon nanotube circuit optimization . First ,
we ...

Author: Chris Luhrs

Publisher:

ISBN: STANFORD:36105210207028

Category:

Page: 158

View: 435

Categories:

ISLPED 01

ISLPED 01

Double-Gate Fully-Depleted SOI Transistors for Low-Power High-Performance
Nano-Scale Circuit Design ~ Rongtian Zhang ... the added back-channel leakage
; and how the coupling between the front- and back-gates affects circuit reliability.

Author: ACM Special Interest Group on Design Automation

Publisher:

ISBN: PSU:000048857123

Category: Technology & Engineering

Page: 395

View: 294

Categories: Technology & Engineering

Forward Error Correction Biosensors

Forward Error Correction Biosensors

In the literature , FEC principles have been used for improving reliability of
nanoscale systems , which suffer from similar computational artifacts as storage
systems . Some of the examples include design of fault - tolerant circuits ( 109 )
and ...

Author: Yang Liu

Publisher:

ISBN: MSU:31293030635456

Category: Biosensors

Page: 368

View: 240

Categories: Biosensors

Nanoelectronic Mixed Signal System Design

Nanoelectronic Mixed Signal System Design

The significant demand for portable systems combined with other issues, such as
reliability, thermal considerations, and ... a significant component of leakage
dissipation is one of the major issues in nanoscale circuits and system design [99
].

Author: Saraju Mohanty

Publisher: McGraw Hill Professional

ISBN: 9780071823036

Category: Technology & Engineering

Page: 832

View: 159

Covering both the classical and emerging nanoelectronic technologies being used in mixed-signal design, this book addresses digital, analog, and memory components. Winner of the Association of American Publishers' 2016 PROSE Award in the Textbook/Physical Sciences & Mathematics category. Nanoelectronic Mixed-Signal System Design offers professionals and students a unified perspective on the science, engineering, and technology behind nanoelectronics system design. Written by the director of the NanoSystem Design Laboratory at the University of North Texas, this comprehensive guide provides a large-scale picture of the design and manufacturing aspects of nanoelectronic-based systems. It features dual coverage of mixed-signal circuit and system design, rather than just digital or analog-only. Key topics such as process variations, power dissipation, and security aspects of electronic system design are discussed. Top-down analysis of all stages--from design to manufacturing Coverage of current and developing nanoelectronic technologies--not just nano-CMOS Describes the basics of nanoelectronic technology and the structure of popular electronic systems Reveals the techniques required for design excellence and manufacturability
Categories: Technology & Engineering

Moore s Law and Nanotechnology

Moore s Law and Nanotechnology

It was discovered that cell sizing and circuit configuration play important roles in
the relative gain in reliability when employing TTMR . ... point at which a TMR
system with a perfect voter begins to offer a higher reliability than a simplex
system ) , redundant schemes seem ... um devices , but it is not clear , however , if
such methods would be applicable to and improve the reliability of nanoscale
devices .

Author: John William McCann

Publisher:

ISBN: UCAL:X66591

Category:

Page: 122

View: 215

Categories:

High Mixed Voltage Analog and RF Circuit Techniques for Nanoscale CMOS

High  Mixed Voltage Analog and RF Circuit Techniques for Nanoscale CMOS

This book presents high-/mixed-voltage analog and radio frequency (RF) circuit techniques for developing low-cost multistandard wireless receivers in nm-length CMOS processes.

Author: Pui-In Mak

Publisher: Springer Science & Business Media

ISBN: 9781441995384

Category: Technology & Engineering

Page: 146

View: 191

This book presents high-/mixed-voltage analog and radio frequency (RF) circuit techniques for developing low-cost multistandard wireless receivers in nm-length CMOS processes. Key benefits of high-/mixed-voltage RF and analog CMOS circuits are explained, state-of-the-art examples are studied, and circuit solutions before and after voltage-conscious design are compared. Three real design examples are included, which demonstrate the feasibility of high-/mixed-voltage circuit techniques. Provides a valuable summary and real case studies of the state-of-the-art in high-/mixed-voltage circuits and systems; Includes novel high-/mixed-voltage analog and RF circuit techniques – from concept to practice; Describes the first high-voltage-enabled mobile-TVRF front-end in 90nm CMOS and the first mixed-voltage full-band mobile-TV Receiver in 65nm CMOS; Demonstrates the feasibility of high-/mixed-voltage circuit techniques with real design examples.
Categories: Technology & Engineering

Fault tolerant Synthesis Using Non uniform Redundancy

Fault tolerant Synthesis Using Non uniform Redundancy

[ 18 ] M. Choudhury and K. Mohanram , “ Reliability analysis of logic circuits , ”
Computer - Aided Design of Integrated Circuits and Systems , IEEE Transactions
on , vol . 28 , no . 3 , pp . 392– 405 , March 2009 . [ 19 ] S. Ercolani , M. Favalli , M.

Author: Keven L. Woo

Publisher:

ISBN: UCAL:X82950

Category:

Page: 116

View: 542

Categories:

System on Chip

System on Chip

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

Author: Bashir M. Al-Hashimi

Publisher: IET

ISBN: 9780863415524

Category: Computers

Page: 911

View: 722

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts in the field. This book covers the general principles of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. The book has twenty five chapters organised into eight parts, each part focuses on a particular topic of SoC. Each chapter has some background covering the basic principles, and extensive list of references. It is aimed at graduate students, designers and managers working in Electronic and Computer engineering.
Categories: Computers

Power Integrity for Nanoscale Integrated Systems

Power Integrity for Nanoscale Integrated Systems

Proven methods for noise-tolerant nanoscale integrated circuit design This leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and ...

Author: Masanori Hashimoto

Publisher: McGraw Hill Professional

ISBN: 9780071787772

Category: Technology & Engineering

Page: 512

View: 968

Proven methods for noise-tolerant nanoscale integrated circuit design This leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and the latest design trends, including low-power design. Power Integrity for Nanoscale Integrated Systems describes how these problems can be forecast early in the design process and the countermeasures that can be used to address them, such as the inclusion of inductance and accurate modeling for PI analysis, as well as robust circuit design. Detailed examples and a case study on the IBM POWER7+ processor illustrate real-world applications of the techniques presented in this practical resource. Coverage includes: Significance of power integrity for integrated circuits Supply and substrate noise impact on circuits Clock generation and distribution with power integrity Signal and power integrity design for I/O circuits Power integrity degradation and modeling Lumped, distributed, and 3D modeling for power integrity Chip temperature and PI impact Low-power techniques and PI impact Power integrity case study using the IBM POWER7+ processor chip Carbon nanotube interconnects for power delivery
Categories: Technology & Engineering