An Introduction to Control Systems

Author: K. Warwick

Publisher: World Scientific

ISBN: 9789810225971

Category: Technology & Engineering

Page: 362

View: 8244

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This significantly revised edition presents a broad introduction to Control Systems and balances new, modern methods with the more classical. It is an excellent text for use as a first course in Control Systems by undergraduate students in all branches of engineering and applied mathematics. The book contains: A comprehensive coverage of automatic control, integrating digital and computer control techniques and their implementations, the practical issues and problems in Control System design; the three-term PID controller, the most widely used controller in industry today; numerous in-chapter worked examples and end-of-chapter exercises. This second edition also includes an introductory guide to some more recent developments, namely fuzzy logic control and neural networks.
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Computational Science - ICCS 2001

International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings

Author: Vassil N. Alexandrov,Jack J. Dongarra,Benjoe A. Juliano,Rene S. Renner,C.J.Kenneth Tan

Publisher: Springer

ISBN: 3540457186

Category: Computers

Page: 1081

View: 9442

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LNCS volumes 2073 and 2074 contain the proceedings of the International Conference on Computational Science, ICCS 2001, held in San Francisco, California, May 27-31, 2001. The two volumes consist of more than 230 contributed and invited papers that reflect the aims of the conference to bring together researchers and scientists from mathematics and computer science as basic computing disciplines, researchers from various application areas who are pioneering advanced application of computational methods to sciences such as physics, chemistry, life sciences, and engineering, arts and humanitarian fields, along with software developers and vendors, to discuss problems and solutions in the area, to identify new issues, and to shape future directions for research, as well as to help industrial users apply various advanced computational techniques.
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An Introduction to Numerical Analysis for Electrical and Computer Engineers

Author: Christopher J. Zarowski

Publisher: John Wiley & Sons

ISBN: 9780471650409

Category: Mathematics

Page: 608

View: 4959

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This book is an introduction to numerical analysis and intendsto strike a balance between analytical rigor and the treatment ofparticular methods for engineering problems Emphasizes the earlier stages of numerical analysis forengineers with real-life problem-solving solutions applied tocomputing and engineering Includes MATLAB oriented examples An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment.
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Industrial Digital Control Systems

Author: K. Warwick,D. Rees

Publisher: IET

ISBN: 9780863411373

Category: Technology & Engineering

Page: 523

View: 9534

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Includes: Digital signals and systems. Digital controllers for process control applications. Design of digital controllers. Control of time delay systems. State-space concepts. System identification. Introduction to discrete optimal control. Multivariable control. Adaptive control. Computer aided design for industrial control systems. Reliability and redundancy in microprocessor controllers. Software and hardware aspects of industrial controller implementations. Application of distributed digital control algorithms to power stations. An expert system for process control.
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Automation in Textile Machinery

Instrumentation and Control System Design Principles

Author: L. Ashok Kumar,M Senthil kumar

Publisher: CRC Press

ISBN: 1351651374

Category: Technology & Engineering

Page: 426

View: 1772

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Automation is the use of various control systems for operating equipment such as machinery and processes. In line, this book deals with comprehensive analysis of the trends and technologies in automation and control systems used in textile engineering. The control systems descript in all chapters is to dissect the important components of an integrated control system in spinning, weaving, knitting, chemical processing and garment industries, and then to determine if and how the components are converging to provide manageable and reliable systems throughout the chain from fiber to the ultimate customer. Key Features: • Describes the design features of machinery for operating various textile machineries in product manufacturing • Covers the fundamentals of the instrumentation and control engineering used in textile machineries • Illustrates sensors and basic elements for textile automation • Highlights the need of robotics in textile engineering • Reviews the overall idea and scope of research in designing textile machineries
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Schaum’s Outline of Feedback and Control Systems, 2nd Edition

Author: Joseph J Distefano

Publisher: McGraw Hill Professional

ISBN: 0071830766

Category: Study Aids

Page: 496

View: 8628

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Tough Test Questions? Missed Lectures? Not Enough Time? Fortunately for you, there’s Schaum's. This all-in-one-package includes more than 700 fully solved problems, examples, and practice exercises to sharpen your problem-solving skills. Plus, you will have access to 20 detailed videos featuring instructors who explain the most commonly tested problems--it's just like having your own virtual tutor! You'll find everything you need to build confidence, skills, and knowledge for the highest score possible. More than 40 million students have trusted Schaum's to help them succeed in the classroom and on exams. Schaum's is the key to faster learning and higher grades in every subject. Each Outline presents all the essential course information in an easy-to-follow, topic-by-topic format. You also get hundreds of examples, solved problems, and practice exercises to test your skills. This Schaum's Outline gives you 700 fully solved problems Extra practice on topics such as differential equations and linear systems, transfer functions, block diagram algebra, and more Support for all major textbooks for feedback and control systems courses Fully compatible with your classroom text, Schaum's highlights all the important facts you need to know. Use Schaum’s to shorten your study time--and get your best test scores! Schaum's Outlines--Problem Solved.
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Handbook of Systems Engineering and Management

Author: Andrew P. Sage,William B. Rouse

Publisher: John Wiley & Sons

ISBN: 0470083530

Category: Technology & Engineering

Page: 1476

View: 1488

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The trusted handbook?now in a new edition This newly revised handbook presents a multifaceted view of systems engineering from process and systems management perspectives. It begins with a comprehensive introduction to the subject and provides a brief overview of the thirty-four chapters that follow. This introductory chapter is intended to serve as a "field guide" that indicates why, when, and how to use the material that follows in the handbook. Topical coverage includes: systems engineering life cycles and management; risk management; discovering system requirements; configuration management; cost management; total quality management; reliability, maintainability, and availability; concurrent engineering; standards in systems engineering; system architectures; systems design; systems integration; systematic measurements; human supervisory control; managing organizational and individual decision-making; systems reengineering; project planning; human systems integration; information technology and knowledge management; and more. The handbook is written and edited for systems engineers in industry and government, and to serve as a university reference handbook in systems engineering and management courses. By focusing on systems engineering processes and systems management, the editors have produced a long-lasting handbook that will make a difference in the design of systems of all types that are large in scale and/or scope.
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An Introduction to Mixed-signal IC Test and Measurement

Author: Mark Burns,Gordon W. Roberts,Professor in the Department of Electrical and Computer Engineering Gordon W Roberts

Publisher: Oxford University Press, USA

ISBN: 9780195140163

Category: Technology & Engineering

Page: 684

View: 5275

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Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.
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